DocumentCode :
1018672
Title :
Computing Accurate AVFs using ACE Analysis on Performance Models: A Rebuttal
Author :
Biswas, A. ; Racunas, P. ; Emer, J. ; Mukherjee, S.S.
Author_Institution :
Intel Corp., Hudson, MA
Volume :
7
Issue :
1
fYear :
2008
Firstpage :
21
Lastpage :
24
Abstract :
ACE (architecturally correct execution) analysis computes AVFs (architectural vulnerability factors) of hardware structures. AVF expresses the fraction of radiation-induced transient faults that result in user-visible errors. Architects usually perform this analysis on a high-level performance model to quickly compute per-structure AVFs. If, however, low-level details of a microarchitecture are not modeled appropriately, then their effects may not be reflected in the per-structure AVFs. In this paper we refute Wang, et al.´s (2007) claim that this detail is difficult to model and imposes a practical threshold on ACE analysis that forces its estimates to have a high error margin. We show that carefully choosing a small amount of additional detail can result in a much tighter AVF bound than Wang, et al. were able to achieve in their refined ACE analysis. Even the inclusion of small details, such as read/write pointers and appropriate inter-structure dependencies, can increase the accuracy of the AVF computation by 40% or more. We argue that this is no different than modeling the IPC (instructions per cycle) of a microprocessor pipeline. A less detailed performance model will provide less accurate IPCs. AVFs are no different.
Keywords :
performance evaluation; architectural vulnerability factors; architecturally correct execution analysis; hardware structures; instructions per cycle; inter-structure dependencies; microprocessor pipeline; performance models; radiation-induced transient faults; read pointers; user-visible errors; write pointers; Computational modeling; Hardware; High performance computing; Microarchitecture; Microprocessors; Performance analysis; Pipelines; Protection; Target tracking; Performance and Reliability; Reliability; Testing; Testing and Fault-Tolerance; and Fault-Tolerance;
fLanguage :
English
Journal_Title :
Computer Architecture Letters
Publisher :
ieee
ISSN :
1556-6056
Type :
jour
DOI :
10.1109/L-CA.2007.19
Filename :
4408574
Link To Document :
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