• DocumentCode
    1018694
  • Title

    Temperature dependence and silane consumption during particle formation in Ar-silane RF capacitively coupled plasma

  • Author

    Sorokin, M. ; Kroesen, G.M.W. ; Stoffels, W.W.

  • Author_Institution
    Appl. Phys. Dept., Eindhoven Univ. of Technol., Netherlands
  • Volume
    32
  • Issue
    2
  • fYear
    2004
  • fDate
    4/1/2004 12:00:00 AM
  • Firstpage
    731
  • Lastpage
    737
  • Abstract
    We propose a generalized model, based on a simple balance equation, explaining the temperature dependence of the agglomeration time of nanoclusters in Ar-SiH4 plasmas. This model allows easy incorporation of specific mechanisms and verification of their effect on particle growth. We consider extra silane consumption due to back diffusion, an important issue for the laboratory plasma experiments and modeling results interpretation.
  • Keywords
    argon; dusty plasmas; high-frequency discharges; nanoparticles; plasma chemistry; plasma diagnostics; plasma transport processes; silicon compounds; Ar-SiH4; Ar-silane RF capacitively coupled plasma; agglomeration temperature dependence; back diffusion; balance equation; nanoclusters; particle growth; silane consumption; Dusty plasma; Electrodes; Plasma applications; Plasma chemistry; Plasma density; Plasma diagnostics; Plasma materials processing; Plasma temperature; Radio frequency; Temperature dependence; Complex plasmas; Silane; diagnostics; dust; harmonics; plasma CVD; plasma impedance; temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2004.826137
  • Filename
    1308541