DocumentCode :
1018694
Title :
Temperature dependence and silane consumption during particle formation in Ar-silane RF capacitively coupled plasma
Author :
Sorokin, M. ; Kroesen, G.M.W. ; Stoffels, W.W.
Author_Institution :
Appl. Phys. Dept., Eindhoven Univ. of Technol., Netherlands
Volume :
32
Issue :
2
fYear :
2004
fDate :
4/1/2004 12:00:00 AM
Firstpage :
731
Lastpage :
737
Abstract :
We propose a generalized model, based on a simple balance equation, explaining the temperature dependence of the agglomeration time of nanoclusters in Ar-SiH4 plasmas. This model allows easy incorporation of specific mechanisms and verification of their effect on particle growth. We consider extra silane consumption due to back diffusion, an important issue for the laboratory plasma experiments and modeling results interpretation.
Keywords :
argon; dusty plasmas; high-frequency discharges; nanoparticles; plasma chemistry; plasma diagnostics; plasma transport processes; silicon compounds; Ar-SiH4; Ar-silane RF capacitively coupled plasma; agglomeration temperature dependence; back diffusion; balance equation; nanoclusters; particle growth; silane consumption; Dusty plasma; Electrodes; Plasma applications; Plasma chemistry; Plasma density; Plasma diagnostics; Plasma materials processing; Plasma temperature; Radio frequency; Temperature dependence; Complex plasmas; Silane; diagnostics; dust; harmonics; plasma CVD; plasma impedance; temperature dependence;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2004.826137
Filename :
1308541
Link To Document :
بازگشت