Title :
Noise and the potential minimum at high frequencies
Author_Institution :
University of California, Berkeley, Calif.
fDate :
5/1/1962 12:00:00 AM
Keywords :
Anodes; Cathodes; Charge carrier processes; Circuits; Diodes; Electron devices; Electrons; Feedback; Frequency; Low-frequency noise; Monte Carlo methods; Noise reduction; Plasma devices; Plasmas;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.14989
