Title :
Transmission Lorentz microscopy of two-layered Co80Nb10Ti10films
Author :
Tsukahara, S. ; Morita, H. ; Yamamoto, M. ; Fujimori, H.
Author_Institution :
Electrotechnical Laboratory, Tokyo, Japan
fDate :
9/1/1986 12:00:00 AM
Abstract :
Magnetic domain structures in two layered 300-550 A thick Co80Nb10Ti10films with magnetostatic coupling across nonmagnetic layer with thickness d from 8 to 800 A were examined through transmission Lorentz microscopy at 200 kV. At d= 20 A the coupling of two layers is strongest and two layers are magnetized in parallel direction except the coupled Néel wall regions. At d=40-160 A domains in two layers are magnetized in independent directions but strong coupling between the domain walls in both layers causes complicated domain configuration. The characteristic vertical pair domains and 90° walls play a role to result flux closure between the layers. The maximum thickness of 180° wall reaches 4000 A at this d range.
Keywords :
Amorphous magnetic films/devices; Electron microscopy; Magnetic domains; Amorphous magnetic materials; Couplings; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic separation; Magnetostriction; Perpendicular magnetic anisotropy; Saturation magnetization; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1986.1064552