Title :
High-resolution analysis of exponentially decaying transients for physics d.l.t.s. experiments
Author_Institution :
University of Surrey, Department of Electronic and Electrical Engineering, Guildford, UK
Abstract :
A class of analysing functions is proposed to improve the resolution of the measurement of exponential transients in d.l.t.s. experiments. These functions offer a trade-off between resolution and sensitivity to noise as measured by a signal/noise ratio. Implementation may be by either analogue or digital (point sampling) correlation.
Keywords :
deep levels; transients; DLTS experiments; analogue correlation; analysing functions; deep level transient spectroscopy experiments; digital correlation; exponentially decaying transients; resolution analysis; semiconductor; signal/noise ratio;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790515
