DocumentCode :
1018928
Title :
A Two-Way Josephson Voltage Standard Comparison Between NIST and NRC
Author :
Tang, Yi-hua ; Wood, Barry M. ; Hamilton, Clark A.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD
Volume :
58
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
821
Lastpage :
826
Abstract :
A two-way Josephson voltage standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) has been conducted. The process consists of two comparisons: first, using the NRC JVS with the NRC´s measuring system (hardware and software) to measure the 10 V provided by the NIST JVS and then using the NIST JVS measuring system to measure the 10 V provided by the NRC JVS. The results of the two comparisons are in agreement to within 0.7 nV, and their mean indicates that the difference between the two JVSs at 10 V is -0.28 nV, with a pooled combined uncertainty of 2.07 nV (k = 2) or a relative uncertainty of 2.1 parts in 1010.
Keywords :
measurement standards; measurement uncertainty; voltage measurement; NIST; NRC; National Institute of Standards and Technology; National Research Council; interlaboratory comparison; measuring system; two-way Josephson voltage standard; voltage 10 V; Automation; Josephson voltage standard (JVS); interlaboratory comparison; uncertainty; voltmeter;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.2006960
Filename :
4695952
Link To Document :
بازگشت