Title :
DFT-Based SoC/VLSI IP Protection and Digital Rights Management Platform
Author :
Fan, Yu-Cheng ; Shen, Jan-Hung
Author_Institution :
Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei
fDate :
6/1/2009 12:00:00 AM
Abstract :
In this paper, the author proposes a novel testing-based system-on-a-chip (SoC)/very large scale integration (VLSI) intellectual property (IP) identification and protection platform in SoC/VLSI design. The principles are established for the development of a new IP identification, protection procedures, and a digital rights management system that depends on the current IP-based design flow. This platform can successfully survive synthesis, placement, and routing and identify the IP core at various design levels. The proposed method has the potential to solve the digital rights management problem in SoC/VLSI design.
Keywords :
VLSI; design for testability; digital rights management; industrial property; system-on-chip; DFT-based SoC IP protection; VLSI design; design-for-test; digital rights management system; intellectual property identification; system on chip; very large scale integration; Design for test (DFT); digital rights management (DRM); intellectual property (IP) identification (ID); system on a chip (SoC); very large scale integration (VLSI) design; watermarking;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.2006722