Title :
Noise characteristics in longitudinal thin-film media
Author :
Aoi, H. ; Saitoh, M. ; Nishiyama, N. ; Tsuchiya, R. ; Tamura, T.
Author_Institution :
Central Research Laboratories, Hitachi, Limited., Kokubunji, Tokyo, Japan
fDate :
9/1/1986 12:00:00 AM
Abstract :
The noise of longitudinal thin metal film media is experimentally investigated using a new method: the reverse DC erase media noise measuring method. The reverse DC erase noise of thin metal film shows a sharp peak at the field around coercive force Hc. The maximum reverse DC erase noise has a strong correlation to the signal recorded noise. Media with large noise has low D50and also low Overwrite S/N.
Keywords :
Magnetic noise; Magnetic recording; Coercive force; Current measurement; Magnetic domains; Magnetic films; Magnetic noise; Magnetic recording; Noise figure; Noise generators; Noise measurement; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1986.1064608
