Title :
Capacitance and barrier potential of near-degenerate semiconductor junctions
Author_Institution :
Purdue University, Lafayette, Ind.
Keywords :
Breakdown voltage; Capacitance measurement; Cryogenics; Electric breakdown; Electrons; Gaussian approximation; Gold; Impact ionization; Impurities; Instruments; Ionization; Laboratories; Space charge; Spontaneous emission; Temperature; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.15065
