Title :
Correction to "Rough surface wavelength measurement through self mixing of doppler microwave backscatter"
Author :
Weissman, D. ; Johnson, James W.
Author_Institution :
Hofstra Univ., Hempstead, NY, USA
fDate :
5/1/1980 12:00:00 AM
Keywords :
Backscatter; Equations; NASA; Rough surfaces; Surface roughness; Surface waves; Wavelength measurement;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.1980.1142325
