DocumentCode
1019701
Title
A unified treatment of semiconductor boundary value problems
Author
Scharfetter, D.L. ; Lade, R.W. ; Jordan, A.G.
Author_Institution
Bell Telephone Laboratories, Murray Hill, N. J.
Volume
10
Issue
1
fYear
1963
fDate
1/1/1963 12:00:00 AM
Firstpage
35
Lastpage
43
Abstract
A unified approach to the solution of semiconductor boundary value problems is presented. The terminal voltage (including bulk drops) is derived by taking the total current as the independent variable. At semiconductor interfaces relationships between potential drops and carrier concentrations in the neutral regions are reviewed in terms of both the electrostatic and electrochemical potentials. The terminal voltage is expressed in terms of either the electrostatic or electrochemical potentials. Examples are presented to illustrate the techniques presented in this paper in terms of the familiar RP+NR and not so familiar RvNR diodes.
Keywords
Boundary conditions; Boundary value problems; Charge carriers; Electrostatics; Equations; Semiconductor devices; Semiconductor diodes; Semiconductor materials; Space charge; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1963.15077
Filename
1473380
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