DocumentCode
1019916
Title
Chemical Mapping of Planetary Surfaces
Author
Haines, E.L. ; Arnold, J.R. ; Metzger, A.E.
Author_Institution
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91103
Volume
14
Issue
3
fYear
1976
fDate
7/1/1976 12:00:00 AM
Firstpage
141
Lastpage
153
Abstract
Two instruments, the gamma-ray spectrometer and the X-ray fluorescence spectrometer, are uniquely suited to the chemical mapping of planetary surfaces from orbit. Through their detection of characteristic line spectra they measure the concentrations of a suite of elements in each area overflown. Multielement chemical maps derived from these remote measurements are used in the construction of evolutionary models of planetary bodies and of the solar system as a whole. The NaI(T1) gamma-ray spectrometer and a gas proportional X-ray spectrometer were flown over 20 percent of the lunar surface during the Apollo 15 and 16 missions. These instruments measured chemical differences across the boundaries of known lunar provinces and revealed several new features of lunar-surface composition. Advanced spectrometers which are under development for future missions are able to educe much more information in a given time span than the Apollo instruments. They may be used in possible future missions such as Lunar Polar Orbiter, a Mars orbiter, a Mercury orbiter, outer planet satellite missions, rendezvous with asteroids and cometary nuclei, and surface-penetrating planetary probes.
Keywords
Area measurement; Chemical elements; Extraterrestrial measurements; Fluorescence; Instruments; Mars; Moon; Planetary orbits; Solar system; Spectroscopy;
fLanguage
English
Journal_Title
Geoscience Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9413
Type
jour
DOI
10.1109/TGE.1976.294446
Filename
4071793
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