Title :
Chemical Mapping of Planetary Surfaces
Author :
Haines, E.L. ; Arnold, J.R. ; Metzger, A.E.
Author_Institution :
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91103
fDate :
7/1/1976 12:00:00 AM
Abstract :
Two instruments, the gamma-ray spectrometer and the X-ray fluorescence spectrometer, are uniquely suited to the chemical mapping of planetary surfaces from orbit. Through their detection of characteristic line spectra they measure the concentrations of a suite of elements in each area overflown. Multielement chemical maps derived from these remote measurements are used in the construction of evolutionary models of planetary bodies and of the solar system as a whole. The NaI(T1) gamma-ray spectrometer and a gas proportional X-ray spectrometer were flown over 20 percent of the lunar surface during the Apollo 15 and 16 missions. These instruments measured chemical differences across the boundaries of known lunar provinces and revealed several new features of lunar-surface composition. Advanced spectrometers which are under development for future missions are able to educe much more information in a given time span than the Apollo instruments. They may be used in possible future missions such as Lunar Polar Orbiter, a Mars orbiter, a Mercury orbiter, outer planet satellite missions, rendezvous with asteroids and cometary nuclei, and surface-penetrating planetary probes.
Keywords :
Area measurement; Chemical elements; Extraterrestrial measurements; Fluorescence; Instruments; Mars; Moon; Planetary orbits; Solar system; Spectroscopy;
Journal_Title :
Geoscience Electronics, IEEE Transactions on
DOI :
10.1109/TGE.1976.294446