Title :
High Q variable capacitance diodes with extraordinary capacitance—volt-age dependence
Author :
Edmundson, G. ; Berkstresser, R. ; Sils, V.
fDate :
3/1/1963 12:00:00 AM
Keywords :
Capacitance measurement; Cutoff frequency; Frequency measurement; Noise measurement; Q measurement; Semiconductor device noise; Semiconductor diodes; Temperature dependence; Temperature measurement; Varactors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1963.15096
