• DocumentCode
    1019925
  • Title

    SJ/RESURF LDMOST

  • Author

    Nassif-Khalil, Sameh G. ; Hou, Li Zhang ; Salama, C. Andre T

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
  • Volume
    51
  • Issue
    7
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1185
  • Lastpage
    1191
  • Abstract
    A monolithic lateral double diffused MOSFET (LDMOST) based on the super junction (SJ) concept is proposed to significantly improve the device´s on-state and off-state characteristics. The device structure features a split drift region made of two parts: 1) an SJ structure that extends over most of the drift region and 2) a terminating reduced surface field (RESURF) region occupying a portion of the drift region adjacent to the n+ drain. This structure suppresses substrate-assisted depletion effects and ensures complete depletion and near uniform electric field distribution over the entire drift region. In the on-state, the high conductivity of the SJ drift region results in a significant improvement in the specific on-resistance for a given breakdown voltage (BV) and, hence, a reduction in the on-state, switching, and gate-drive losses. In the off-state, the RESURF region, located near the n+ drain, effectively neutralizes the substrate-assisted depletion effects and results in high BV.
  • Keywords
    losses; power MOSFET; semiconductor device breakdown; LDMOST; RESURF region; breakdown voltage; device offstate; device onstate; electric field distribution; gate-drive losses; lateral double diffused MOSFET; on resistance; power MOSFET; reduced surface field; split drift region; substrate-assisted depletion effect suppression; super junction structure; switching; Breakdown voltage; Conductivity; Councils; Doping; Helium; MOSFET circuits; Microelectronics; Power MOSFET; Silicon on insulator technology; Strontium; Lateral; RESURF; SJ; power MOSFET; super junction;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2004.829876
  • Filename
    1308645