Title :
Syndrome and transition count are uncorrelated [logic circuit testing]
Author :
Saxena, Nirmal R. ; Robinson, John P.
Author_Institution :
Hewlett-Packard, Cupertino, CA, USA
fDate :
1/1/1988 12:00:00 AM
Abstract :
In the testing of logic circuits, two proposed data-compression methods use the number of ones (syndrome) and the number of sequence changes (transition count). An enumeration N(m, k , t) of the number of length-m binary sequences having syndrome value k and transition count t is developed. Examination of this result reveals that the parallel compression of these two methods has small overlap in error masking. An asymptotic expression for N(m, k, t) is developed
Keywords :
binary sequences; data compression; logic testing; binary sequences; built-in testing; data-compression methods; error masking; logic circuits; parallel compression; syndrome; testing; transition count; Binary sequences; Circuit faults; Circuit testing; Compaction; Data compression; Linear feedback shift registers; Logic circuits; Logic testing; Upper bound; Very large scale integration;
Journal_Title :
Information Theory, IEEE Transactions on
