Title :
A tunnel emission triode
Author :
Schwarz, R. ; Zimmerman, E.
fDate :
3/1/1963 12:00:00 AM
Keywords :
Coupling circuits; Electrodes; Frequency measurement; Integrated circuit yield; Logic arrays; Oxidation; Silicon; Switches; Temperature dependence; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1963.15130
