• DocumentCode
    1020513
  • Title

    Improving the Performance of Superjunction Devices Having Fixed Charge in Isolation and Termination Oxide Layers

  • Author

    Balaji, S. ; Karmalkar, Shreepad

  • Author_Institution
    IBM India Pvt Ltd., Bangalore
  • Volume
    55
  • Issue
    1
  • fYear
    2008
  • Firstpage
    446
  • Lastpage
    451
  • Abstract
    This paper concerns superjunctions which employ oxide layers for isolating n- and p-pillars and in terminating the device. In our earlier work, we pointed out that oxide fixed charges significantly reduce the breakdown voltage of such devices. In this paper, we discuss various techniques in compensating the effects of oxide fixed charge so as to design such a device having the minimum specific on-resistance for a given breakdown voltage. The techniques include doping modification and reduction in the widths of terminating pillars and nonconducting pillars in the on-state. We also analyze the relative contributions of oxide fixed charges and doping-related charge imbalance to breakdown reduction to highlight the significance of oxide fixed charges.
  • Keywords
    power MOSFET; semiconductor device breakdown; breakdown voltage; minimum specific on-resistance; oxide fixed charge; oxide layers; power MOSFET; superjunction devices; Doping; Electric breakdown; Electrodes; Helium; MOSFET circuits; P-n junctions; Power MOSFET; Semiconductor diodes; Termination of employment; Voltage; Breakdown voltage; on-resistance; oxide fixed charge; power MOSFET; superjunction;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.911097
  • Filename
    4408771