DocumentCode
1020513
Title
Improving the Performance of Superjunction Devices Having Fixed Charge in Isolation and Termination Oxide Layers
Author
Balaji, S. ; Karmalkar, Shreepad
Author_Institution
IBM India Pvt Ltd., Bangalore
Volume
55
Issue
1
fYear
2008
Firstpage
446
Lastpage
451
Abstract
This paper concerns superjunctions which employ oxide layers for isolating n- and p-pillars and in terminating the device. In our earlier work, we pointed out that oxide fixed charges significantly reduce the breakdown voltage of such devices. In this paper, we discuss various techniques in compensating the effects of oxide fixed charge so as to design such a device having the minimum specific on-resistance for a given breakdown voltage. The techniques include doping modification and reduction in the widths of terminating pillars and nonconducting pillars in the on-state. We also analyze the relative contributions of oxide fixed charges and doping-related charge imbalance to breakdown reduction to highlight the significance of oxide fixed charges.
Keywords
power MOSFET; semiconductor device breakdown; breakdown voltage; minimum specific on-resistance; oxide fixed charge; oxide layers; power MOSFET; superjunction devices; Doping; Electric breakdown; Electrodes; Helium; MOSFET circuits; P-n junctions; Power MOSFET; Semiconductor diodes; Termination of employment; Voltage; Breakdown voltage; on-resistance; oxide fixed charge; power MOSFET; superjunction;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.911097
Filename
4408771
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