DocumentCode
1020654
Title
High-power AlGaAs laser with a thin tapered-thickness active layer
Author
Murakami, T. ; Ohtaki, K. ; Matsubara, H. ; Yamawaki, T. ; Saito, H. ; Isshiki, K. ; Kokubo, Y. ; Kumabe, H. ; Susaki, W.
Author_Institution
Mitsubishi Electric Corporation, LSI R&D Laboratory, Itami, Japan
Volume
22
Issue
4
fYear
1986
Firstpage
217
Lastpage
218
Abstract
A laser whose active layer is thinner near the mirror facet than the inner region is fabricated. Lasers with narrow beam divergence perpendicular to the junction, as narrow as 10°-20°, are obtained with little increase of threshold current. For lasers emitting at 780 nm, stable 30 mW operation at 50°C has been confirmed without obvious degradation over 4000 h.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; liquid phase epitaxial growth; semiconductor junction lasers; 30 mW operation; 50°C; 780 nm; AlGaAs laser; LPE; liquid phase epitaxy; ridged substrate; semiconductor lasers; tapered-thickness active layer;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860151
Filename
4256339
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