DocumentCode :
1020688
Title :
Low Power and Power Management for CMOS—An EDA Perspective
Author :
Kawa, Jamil
Author_Institution :
Synopsys Inc., Mountain View
Volume :
55
Issue :
1
fYear :
2008
Firstpage :
186
Lastpage :
196
Abstract :
Power management and power optimization continue to play a crucial role as CMOS technology scales further beyond 45 nm not just because of the stringent power budgets, particularly for untethered systems, but also because of reliability considerations, and of packaging and cooling costs as well. Process technologists have the biggest role in coming up with device solutions to optimize dynamic power and, most importantly, to suppress wasteful leakage power. However, the management of power hardly stops there. Developers of engineering design automation (EDA) tools have a major and significant role in automating power management techniques realized by circuit, logic, and system designers. This paper addresses power management and optimization with a special emphasis on the role the EDA tools play. It also discusses the close chronological relation between advances in device technology and the corresponding efforts that follow in design automation to address the implications of those device advances.
Keywords :
CMOS integrated circuits; electronic design automation; integrated circuit design; integrated circuit modelling; low-power electronics; CMOS process technology; EDA tools; engineering design automation tools; low power design; power management; power optimization; CMOS technology; Cooling; Design automation; Electronic design automation and methodology; Energy management; Financial management; Packaging; Power system management; Power system reliability; Technology management; Dual-$V_{rm TH}$; dynamic power; dynamic voltage scaling (DVS); engineering design automation (EDA); multithreshold CMOS (MTCMOS); static leakage; subthreshold leakage; voltage islands;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.911041
Filename :
4408787
Link To Document :
بازگشت