• DocumentCode
    1020690
  • Title

    Diode operation of a transistor in functional blocks

  • Author

    Lin, H.C.

  • Author_Institution
    Westinghouse Molecular Electronics Division, Pittsburgh, Pa.
  • Volume
    10
  • Issue
    3
  • fYear
    1963
  • fDate
    5/1/1963 12:00:00 AM
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    Many functional blocks have a basic double-diffused three-layer n-p-n or p-n-p structure to permit the incorporation of transistors. If diodes are also to be incorporated in the block, it is often more convenient to connect the transistor structure already present as a diode so that "batch" processing can be used. There are five different ways to connect a transistor as a diode, either by opening certain electrodes or by short-circuiting a pair of electrodes. The different connections are compared both analytically and experimentally on the basis of forward voltage drop, recovery time and reverse characteristics. It is found that the shorted collector -base connection has the shortest recovery time, comparable to fast computer diodes, and a lower forward voltage drop than the open collector diode connection. The performance is almost equivalent to a diode with a metallic contact in place of the collector. The shorted emitter-base connection has the lowest forward voltage drop. There is good agreement between theory and experiments. The applications of this analysis to the design and fabrication of a high-speed nonsaturated diode-emitter follower AND gate functional block will be illustrated.
  • Keywords
    Application software; Charge carrier density; Diodes; Electrodes; Equations; Fabrication; Molecular electronics; Temperature; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1963.15174
  • Filename
    1473477