Title :
Cool Chips: Opportunities and Implications for Power and Thermal Management
Author :
Lin, Sheng-Chih ; Banerjee, Kaustav
Author_Institution :
California Univ., Santa Barbara
Abstract :
Alongside innovative device, circuit, and microarchitecture level techniques to alleviate power and thermal problems in nanoscale CMOS-based integrated circuits (ICs), chip cooling could be an effective knob for power and thermal management. This paper analyzes IC cooling while focusing on the practical temperature range of operation. Comprehensive analyses of chip cooling for various nanometer scale bulk-CMOS and silicon-on-insulator (SOI) technologies are presented. Unlike all previous works, this analysis employs a holistic approach (combines device, circuit and system level considerations) and also takes various electrothermal couplings between power dissipation, operating frequency and die temperature into account. While chip cooling always gives performance gain at the device and circuit level, it is shown that system level power defines a temperature limit beyond which cooling gives diminishing returns and an associated cost that may be prohibitive. A scaling analysis of this temperature limit is also presented. Furthermore, it is shown that on-chip thermal gradients cannot be mitigated by global chip cooling and that localized cooling can be more effective in removing hot-spots.
Keywords :
CMOS integrated circuits; cooling; nanoelectronics; silicon-on-insulator; thermal management (packaging); IC cooling; SOI; chip cooling; cool chips; die temperature; electrothermal couplings; holistic approach; localized cooling; nanoscale CMOS-based integrated circuits; on-chip thermal gradients; operating frequency; power dissipation; power management; scaling analysis; silicon-on-insulator technologies; temperature limit; thermal management; CMOS integrated circuits; Cooling; Energy management; Innovation management; Microarchitecture; Nanoscale devices; Power system management; Silicon on insulator technology; Temperature; Thermal management; Cooling; integrated circuits; performance; power consumption; thermal management;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.911763