Title :
Comments on "Characterization of the random array peak sidelobe"
Author :
Agrawal, Vishwani D. ; Lo, Yuen T.
Author_Institution :
Bell Laboratories, Murray Hill, NJ, USA
fDate :
11/1/1980 12:00:00 AM
Abstract :
It is pointed out that the analysis of overshoots used in the above paper has been applied to random array sidelobes by several others in the past. Various results are compared with computer simulation.
Keywords :
Antennas and propagation; Backscatter; Electromagnetic propagation; Electromagnetic scattering; Optical propagation; Optical scattering; Optical surface waves; Rough surfaces; Shadow mapping; Surface roughness;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.1980.1142443
