DocumentCode :
1020904
Title :
Distortion in transistor amplifiers
Author :
Gardner, F.M.
Volume :
10
Issue :
4
fYear :
1963
fDate :
7/1/1963 12:00:00 AM
Firstpage :
288
Lastpage :
289
Keywords :
Breakdown voltage; Crystalline materials; Distortion measurement; Epitaxial layers; Fabrication; Impurities; Permission; Silicon; Substrates; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1963.15194
Filename :
1473497
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1020904
