• DocumentCode
    1020905
  • Title

    Fully Coupled Nonequilibrium Electron–Phonon Transport in Nanometer-Scale Silicon FETs

  • Author

    Rowlette, Jeremy A. ; Goodson, Kenneth E.

  • Author_Institution
    Stanford Univ., Stanford
  • Volume
    55
  • Issue
    1
  • fYear
    2008
  • Firstpage
    220
  • Lastpage
    232
  • Abstract
    Heat conduction from transistors and interconnects is a critical design consideration for computing below the 20-nm milestone. This paper reviews detailed heat generation and transport mechanisms in silicon devices with a focus on the nonequilibrium behavior of electrons and phonons. Fully coupled and self-consistent ballistic phonon and electron simulations are developed in order to examine the departure from equilibrium within the phonon system and its relevance for properly simulating the electrical behavior of devices. We illustrate the manner in which nanoscale-transport phenomena are critically important for a broad variety of low-dimensional silicon-based devices, including FinFETs and depleted substrate transistors.
  • Keywords
    Monte Carlo methods; electron-phonon interactions; elemental semiconductors; field effect transistors; heat conduction; silicon; thermal management (packaging); Monte Carlo method; electron simulations; heat conduction; heat generation; nanometer-scale silicon FET; nonequilibrium electron-phonon transport; optical phonon; self-consistent ballistic phonon; Electrons; FETs; FinFETs; Integrated circuit interconnections; Nanoscale devices; Nanotechnology; Phonons; Silicon devices; Thermal management; Thermal resistance; CMOS; FinFET; Monte Carlo; heat; multigate; nanoscale; nanotechnology; nonequilibrium; optical phonon; phonon lifetime; phonons; power; thermal; transistor; transport;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.911043
  • Filename
    4408808