DocumentCode
1020905
Title
Fully Coupled Nonequilibrium Electron–Phonon Transport in Nanometer-Scale Silicon FETs
Author
Rowlette, Jeremy A. ; Goodson, Kenneth E.
Author_Institution
Stanford Univ., Stanford
Volume
55
Issue
1
fYear
2008
Firstpage
220
Lastpage
232
Abstract
Heat conduction from transistors and interconnects is a critical design consideration for computing below the 20-nm milestone. This paper reviews detailed heat generation and transport mechanisms in silicon devices with a focus on the nonequilibrium behavior of electrons and phonons. Fully coupled and self-consistent ballistic phonon and electron simulations are developed in order to examine the departure from equilibrium within the phonon system and its relevance for properly simulating the electrical behavior of devices. We illustrate the manner in which nanoscale-transport phenomena are critically important for a broad variety of low-dimensional silicon-based devices, including FinFETs and depleted substrate transistors.
Keywords
Monte Carlo methods; electron-phonon interactions; elemental semiconductors; field effect transistors; heat conduction; silicon; thermal management (packaging); Monte Carlo method; electron simulations; heat conduction; heat generation; nanometer-scale silicon FET; nonequilibrium electron-phonon transport; optical phonon; self-consistent ballistic phonon; Electrons; FETs; FinFETs; Integrated circuit interconnections; Nanoscale devices; Nanotechnology; Phonons; Silicon devices; Thermal management; Thermal resistance; CMOS; FinFET; Monte Carlo; heat; multigate; nanoscale; nanotechnology; nonequilibrium; optical phonon; phonon lifetime; phonons; power; thermal; transistor; transport;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.911043
Filename
4408808
Link To Document