DocumentCode :
1021190
Title :
Behavior of CdS thin film transistors
Author :
Haering, R.R.
Volume :
10
Issue :
5
fYear :
1963
fDate :
9/1/1963 12:00:00 AM
Firstpage :
335
Lastpage :
335
Keywords :
Conductors; Electrodes; Energy states; Fabrication; Heterojunctions; Insulation; Low-frequency noise; Semiconductor process modeling; Thin film transistors; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1963.15225
Filename :
1473528
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1021190
