• DocumentCode
    1021206
  • Title

    Test Generation Techniques

  • Author

    Akers, Sheldon B.

  • Author_Institution
    General Electric Company
  • Volume
    13
  • Issue
    3
  • fYear
    1980
  • fDate
    3/1/1980 12:00:00 AM
  • Firstpage
    9
  • Lastpage
    15
  • Abstract
    Existing test generation procedures are rooted in the SSI/MSI era. New techniques will cope with today´s vastly more complicated LSI/VLSI systems.
  • Keywords
    Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Life testing; Microelectronics; System testing;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1980.1653524
  • Filename
    1653524
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1021206