Title :
Test Generation Techniques
Author :
Akers, Sheldon B.
Author_Institution :
General Electric Company
fDate :
3/1/1980 12:00:00 AM
Abstract :
Existing test generation procedures are rooted in the SSI/MSI era. New techniques will cope with today´s vastly more complicated LSI/VLSI systems.
Keywords :
Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Life testing; Microelectronics; System testing;
DOI :
10.1109/MC.1980.1653524
