Title :
Testability Considerotions in Microprocessor-Based Design
Author :
Hayes, John P. ; McCluskey, Edward J.
Author_Institution :
University of Southern California
fDate :
3/1/1980 12:00:00 AM
Abstract :
Microprocessors are difficult to test–many failure modes exist and access to internal components is limited. Design techniques that enhance testability can reduce the impact of these constraints.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Concurrent computing; Digital systems; Electrical fault detection; Microprocessors; System testing; Test pattern generators;
DOI :
10.1109/MC.1980.1653526
