DocumentCode
1021230
Title
Testability Considerotions in Microprocessor-Based Design
Author
Hayes, John P. ; McCluskey, Edward J.
Author_Institution
University of Southern California
Volume
13
Issue
3
fYear
1980
fDate
3/1/1980 12:00:00 AM
Firstpage
17
Lastpage
26
Abstract
Microprocessors are difficult to test–many failure modes exist and access to internal components is limited. Design techniques that enhance testability can reduce the impact of these constraints.
Keywords
Automatic testing; Circuit faults; Circuit testing; Concurrent computing; Digital systems; Electrical fault detection; Microprocessors; System testing; Test pattern generators;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/MC.1980.1653526
Filename
1653526
Link To Document