Design and simulation of waveguide electrooptic beam deflectors

Author

Chiu, Y. ; Burton, R.S. ; Stancil, D.D. ; Schlesinger, T.E.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

13

Issue

10

fYear

1995

fDate

10/1/1995 12:00:00 AM

Firstpage

2049

Lastpage

2052

Abstract

Numerical simulation based on the scalar beam propagation method, was used to investigate the performance of waveguide electrooptic beam deflectors. The deflectors under investigation consist of a stack of electrooptically controlled prisms in a waveguide. The results were compared to earlier simplified analysis. It was found that for given overall device dimensions, the number of interfaces between prisms in a prism-type electrooptic deflector has significant influence on the device performance when it is small. To avoid wavefront distortion, unwanted reflection from the interfaces, and asymmetry in the deflection angles caused by small number of interfaces, one should use more than about ten interfaces in a typical deflector. Additional insights of device operation and design issues are discussed

Keywords

aberrations; electro-optical deflectors; numerical analysis; optical design techniques; optical noise; optical planar waveguides; optical prisms; optical waveguide components; optical waveguide theory; deflection angles; design issues; device dimensions; device operation; device performance; electrooptically controlled prisms; numerical simulation; prism-type electrooptic deflector; prisms; scalar beam propagation method; unwanted reflection; wavefront distortion; waveguide electrooptic beam deflector design; waveguide electrooptic beam deflector simulation; Electrooptic deflectors; Electrooptic effects; Electrooptical waveguides; Geometrical optics; Numerical simulation; Optical distortion; Optical harmonic generation; Optical refraction; Optical waveguides; Substrates;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.469729

Filename

469729