DocumentCode
1021434
Title
Localization and characterization of sub-surface particles in magnetic tape
Author
Staals, A.A. ; Van Houwelingen, M.C. ; Huisman, H.F. ; Mulder, C. A M
Author_Institution
PD Magnetics B.V., Molenstraat, Oosterhout, The Netherlands
Volume
23
Issue
1
fYear
1987
fDate
1/1/1987 12:00:00 AM
Firstpage
112
Lastpage
114
Abstract
The scanning transmission electron microscope (STEM), with backscattered and secundary electron detectors, can be used as a tool for characterization and localization of small particles (<1 μm) at the surface and in the coating of magnetic tapes. The combination of energy dispersive X-ray microanalysis with STEM provides information about the chemical composition of the particles of interest.
Keywords
Coatings; Magnetic tape recording; Magnetomechanics; Scanning electron microscopy; Coatings; Magnetic force microscopy; Magnetic properties; Probes; Scanning electron microscopy; Surface topography; Transmission electron microscopy; X-ray detection; X-ray detectors; X-ray scattering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1064770
Filename
1064770
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