• DocumentCode
    1021770
  • Title

    Transistor noise at low temperatures

  • Author

    Bruncke, W.C. ; Chenette, E.R. ; van der Ziel, A.

  • Author_Institution
    University of Minnesota, Minneapolis, Minn.
  • Volume
    11
  • Issue
    2
  • fYear
    1964
  • fDate
    2/1/1964 12:00:00 AM
  • Firstpage
    50
  • Lastpage
    53
  • Abstract
    It is shown that the shot noise theory of transistors holds for low temperatures in alloy junction transistors, provided that the effect of hole-electron pair recombination in the emitter transition region is taken into account. The discrepancy between theory and experiment reported by Lee and Kaminsky can be accounted for by the fact that this process was ignored.
  • Keywords
    Diodes; Electrical resistance measurement; Frequency measurement; Impedance; Integrated circuit noise; Low-frequency noise; Noise generators; Noise measurement; Spontaneous emission; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1964.15282
  • Filename
    1473670
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1021770