DocumentCode :
1021801
Title :
Note on contrast measures and polynomial classifiers
Author :
Sanz, Jorge L C ; Hinkle, Eric B.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
76
Issue :
3
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
294
Lastpage :
296
Abstract :
The application of a contrast measure for segmenting images and the relationship of this method to polynomial-based classification are considered. The relevance of the segmentation method is shown by applying the contrast measure to a semiconductor manufacturing inspection problem. The contrast measure is shown to be a particular case of a pixel classification technique based on polynomial decision functions and local texture features. This relationship integrates an important heuristic method with the rigorous theory of decision-theoretic classification
Keywords :
inspection; picture processing; semiconductor device manufacture; contrast measures; decision-theoretic classification; heuristic method; inspection problem; local texture features; pixel classification technique; polynomial classifiers; segmentation method; Computer science; Image edge detection; Image enhancement; Image segmentation; Inspection; Measurement standards; Particle measurements; Polynomials; Region 4; Semiconductor device manufacture;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.4412
Filename :
4412
Link To Document :
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