DocumentCode
1021885
Title
Complex permittivity measurement of optoelectronic substrates
Author
Bourreau, D. ; Guillon, P. ; Chatard-Moulin, M.
Author_Institution
UER des Sciences, LCOM, UA CNRS 356, Limoges, France
Volume
22
Issue
7
fYear
1986
Firstpage
399
Lastpage
400
Abstract
We propose and analyse new techniques to measure both transverse and longitudinal dielectric constants and the loss tangent of anisotropic dielectric samples usually used in integrated optics such as LiNbO3
Keywords
dielectric loss measurement; integrated optics; permittivity measurement; LiNbO3; anisotropic dielectric samples; complex permittivity measurement; integrated optics; longitudinal dielectric constants; loss tangent; optoelectronic substrates; transverse dielectric constant;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860271
Filename
4256463
Link To Document