Title :
Maximum collector voltage and secondary breakdown in transistors
Author :
Reich, B. ; Hakim, E.B.
fDate :
3/1/1964 12:00:00 AM
Keywords :
Breakdown voltage; Capacitance; Electric resistance; Electrical resistance measurement; Equations; Laboratories; Manufacturing; Temperature; Thermal resistance; Transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15297
