• DocumentCode
    1022196
  • Title

    Resonant phenomena in conductor-backed coplanar waveguides (CBCPW´s)

  • Author

    Lo, Wen-Teng ; Tzuang, Ching-Kuang C. ; Peng, S.T. ; Tien, Ching-Cheng ; Chang, Chung-Chi ; Huang, Jenq-Wen

  • Author_Institution
    Inst. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    41
  • Issue
    12
  • fYear
    1993
  • fDate
    12/1/1993 12:00:00 AM
  • Firstpage
    2099
  • Lastpage
    2108
  • Abstract
    A thorough and systematic investigation of resonant phenomena in conductor-backed coplanar waveguides (CBCPWs) is reported. A rigorous three dimensional full-wave space-domain integral equation method accompanied by an S-parameter extraction technique is used. A series of measurements has been conducted to confirm the theoretical results. A patch-resonator model and a microstriplike (MSL) model are employed to understand the origin of resonance existing in one of the test circuits. The 3-D program is also invoked by displaying the current distributions to help visualize how the CBCPW test circuits work at both through and resonant states. The results obtained validate the conclusions drawn for the patch-resonator model and the MSL model
  • Keywords
    S-parameters; antenna theory; circuit resonance; current distribution; eigenvalues and eigenfunctions; microstrip antennas; waveguide theory; waveguides; 3D full-wave space-domain integral equation method; S-parameter extraction technique; antenna model; circuit resonance; conductor-backed coplanar waveguides; current distributions; dispersive propagation constants; microstriplike model; mixed potential eigenfunction expansion; patch-resonator model; resonant phenomena; through line circuits; Circuit testing; Coplanar waveguides; Electromagnetic waveguides; Frequency measurement; Microwave propagation; Planar waveguides; RLC circuits; Resonance; Resonant frequency; Waveguide components;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.260693
  • Filename
    260693