DocumentCode :
1022329
Title :
Study of layered and coevaporated V(Mo)N and (V/Si)N films
Author :
Gibson, G.A. ; Moodera, J.S. ; Tedrow, P.M. ; Meservey, R.
Author_Institution :
Massachusetts Institute of Technology, Cambridge, Massachusetts
Volume :
23
Issue :
2
fYear :
1987
fDate :
3/1/1987 12:00:00 AM
Firstpage :
1377
Lastpage :
1380
Abstract :
Layered and coevaporated V/Mo samples were nitrided and their Tc´s and spin-orbit scattering rates were compared. This is of Interest because of the close lattice match of VN with the postulated high Tcof cubic MoN. In no case was a Tchigher than that of VN obtained. The spin-orbit scattering rate was found to be larger in the layered (V/Mo)N samples than in the coevaporated ones. We have compared (V/Mo)N and similarly made (V/Si)N multilayer films with theories for the critical field of such structures. Evidence for dimensional crossover was seen in the parallel critical field curve of (V/Mo)N films. Also, the Tcof thin (V/Si)N multilayers was found to be dependent on the Si layer thickness.
Keywords :
Superconducting films; Vanadium materials/devices; Insulation; Lattices; Magnetic separation; Nonhomogeneous media; Proximity effect; Scattering; Superconducting epitaxial layers; Superconducting films; Superconducting magnets; Temperature dependence;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1987.1064849
Filename :
1064849
Link To Document :
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