DocumentCode :
1022415
Title :
IEEE standard test procedure for semiconductor diodes
Volume :
11
Issue :
8
fYear :
1964
fDate :
8/1/1964 12:00:00 AM
Firstpage :
398
Lastpage :
402
Keywords :
Breakdown voltage; Circuit testing; Current measurement; Electric resistance; Electrical resistance measurement; Measurement standards; Pulse measurements; Reproducibility of results; Semiconductor device testing; Semiconductor diodes;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1964.15348
Filename :
1473736
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1022415
