DocumentCode
10225
Title
PLC Performance Analysis Over Rayleigh Fading Channel Under Nakagami-
Additive Noise
Author
Mathur, A. ; Bhatnagar, M.R. ; Panigrahi, B.K.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, New Delhi, India
Volume
18
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
2101
Lastpage
2104
Abstract
Power line communication (PLC) utilizes power lines for transmission of power as well as data transmission. It is an emerging field of communication for the home area network of smart grid. The performance of a PLC system is significantly affected by the additive and multiplicative power line noises; the additive noises are of two types, namely background noise and impulsive noise. Whereas, the multiplicative PLC noise leads to fading in the received signal strength. This paper provides the performance analysis of a PLC system over Rayleigh fading channel under Nakagami- $m$ distributed additive background noise assuming binary phase shift keying modulation scheme. The probability density function of the decision variable is derived. We obtain a numerically computable expression of the analytical average bit error rate of the considered system. The closed-form expression of the outage probability of the PLC system is also computed. Simulation results closely verify the validity of the derived analytical expressions.
Keywords
Nakagami channels; Rayleigh channels; carrier transmission on power lines; data communication; error statistics; home networks; impulse noise; phase shift keying; probability; smart power grids; telecommunication network reliability; Nakagami-m distributed additive background noise; PLC performance analysis; PLC system; Rayleigh fading channel; binary phase shift keying modulation scheme; bit error rate; closed-form expression; data transmission; home area network; impulsive noise; multiplicative PLC noise; outage probability; power line communication; power line noises; probability density function; received signal strength; smart grid; Binary phase shift keying; Bit error rate; Fading channels; Noise measurement; Power line communications; Rayleigh channels; Background noise; Nakagami- $m$ distribution; Nakagami-m distribution; Rayleigh fading; binary phase shift keying; bit error rate; power line communications;
fLanguage
English
Journal_Title
Communications Letters, IEEE
Publisher
ieee
ISSN
1089-7798
Type
jour
DOI
10.1109/LCOMM.2014.2364850
Filename
6935078
Link To Document