• DocumentCode
    1022505
  • Title

    DC SQUIDS made of NbN/a-Si/NbN tunnel junctions

  • Author

    Kuriki, S. ; Matsuda, M. ; Noya, A.

  • Author_Institution
    Hokkaido University, Sapporo, Japan
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    1064
  • Lastpage
    1067
  • Abstract
    We have fabricated planar dc-SQUIDs using all hard metal NbN/a-Si/NbN tunnel junctions. The a-Si barrier is oxidized to block pinholes in an rf plasma. The SQUIDs have a square-washer coil with an inductance of 0.2-0.3 nH; two 4 μm × 4 μm junctions are shunted by resistors of a-Nb3Ge films. An Auger analysis has shown that the a-Si is fully oxidized by the plasma oxidation, but the barrier in the junction is a mixture of Si and Si oxide, indicating a reaction between oxygen of the barrier and Nb of the counter NbN film. We have operated the SQUIDs in a flux-locked loop at a modulation frequency of 92 kHz. The power spectrum of the flux noise has a strong 1/f component which agrees with calculation assuming the temperature fluctuation of the critical current as a main source. At high frequencies the noise spectrum is white at 10-10φ02/Hz including an electronics system noise.
  • Keywords
    Josephson devices; Coils; Counting circuits; Frequency; Inductance; Niobium; Oxidation; Plasmas; Resistors; SQUIDs; Semiconductor films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1064866
  • Filename
    1064866