Title :
Optimization of electrooptic sampling by volume-integral method
Author :
Thomann, W. ; Rottenkolber, M. ; Russer, P.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Univ. Munchen, Germany
fDate :
12/1/1993 12:00:00 AM
Abstract :
A rigorous treatment of the influence of an inhomogeneous electric field on the differential polarization of an optical field and the corresponding change in transmission of retarder setup is presented. The method yields sensitivity coefficients employed directly in a volume integral. In the case of an external electrooptic probe tip a layered structure with a space-harmonic potential and a Gaussian sampling beam is investigated, and results on sensitivity and spatial resolution are presented. The probing of inhomogeneous longitudinal and transverse fields with the same setup is demonstrated for a microstrip transmission line
Keywords :
electro-optical devices; integrated circuit testing; microwave integrated circuits; probes; Gaussian sampling beam; differential polarization; electrooptic sampling; external electrooptic probe tip; inhomogeneous electric field; longitudinal fields; microstrip transmission line; optical field; retarder setup; sensitivity coefficients; space-harmonic potential; spatial resolution; transverse fields; volume-integral method; Microstrip; Nonuniform electric fields; Optical polarization; Optical retarders; Optical sensors; Optimization methods; Probes; Sampling methods; Spatial resolution; Transmission lines;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
