Title :
Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance
Author :
Izpura, José-Ignacio
Author_Institution :
Univ. Politecnica de Madrid, Madrid
fDate :
3/1/2008 12:00:00 AM
Abstract :
Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge´s formula but also allows the design of proper shields to reduce 1/f noise.
Keywords :
1/f noise; capacitors; electron device noise; resistors; thermal noise; backgating noise; capacitor; electrical noise; floating conducting layer; instrumental disturbance; planar resistors; thermal equilibrium; thermal voltage noise; $1/f$ electrical noise; $RC$ cell; $kT/C$ noise; $1/f$ electrical noise; $RC$ cell; $kT/C$ noise; Backgating effect; distributed bias; excess noise; noise measurement; parasitic FET;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.911642