Title :
Gate propagation delay and logic timing of GaAs integrated circuits measured by electro-optic sampling
Author :
Rodwell, Mark J. W. ; Weingarten, Kurt J. ; Freeman, J.L. ; Bloom, D.M.
Author_Institution :
Stanford University, Edward L. Ginzton Laboratory, Stanford, USA
Abstract :
We report techniques for measuring internal switching delays of GaAs digital integrated circuits by electro-optic sampling. Circuit propagation delays of 15 ps are measured. A new phase modulation technique which allows testing of sequential logic is demonstrated with the measurement of a 2·7 GHz 8-phase clock generator.
Keywords :
III-V semiconductors; digital integrated circuits; gallium arsenide; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; 15 ps delay; GaAs integrated circuits; III-V semiconductors; digital IC; electro-optic sampling; gate propagation delay; internal switching delays; logic timing; phase modulation technique; sequential logic; testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860339
