DocumentCode :
1022712
Title :
Gunn effect in GaAs
Author :
Foyt, A.G. ; McWhorter, A.L.
Volume :
11
Issue :
11
fYear :
1964
fDate :
11/1/1964 12:00:00 AM
Firstpage :
530
Lastpage :
530
Keywords :
Capacitance; Charge carrier lifetime; Frequency response; Gallium arsenide; Gunn devices; Laboratories; MOS devices;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1964.15379
Filename :
1473767
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1022712