• DocumentCode
    1022882
  • Title

    DC-SQUIDs fabricated by electron beam direct writing

  • Author

    Carelli, P. ; Foglietti, V. ; Leoni, R.

  • Author_Institution
    Istituto di Elettronica della Stato Solido, C.N.R. Roma, Italy
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    1087
  • Lastpage
    1089
  • Abstract
    An Electron Beam MicroFabricator (EBMF) has been used to write directly on a silicon wafer to obtain many equal chips containing dc-SQUIDs and superconducting test circuitry. We developed a complete lift-off technique on an electronic resist for all the seven needed layers of the process. The first layer, consisting of Au-Pd alloy, is used as resistor and for patterning the markers required to align the various layers. The calibration on such markers avoid the stitching problem due to the large chip dimensions (6.30×6.30 mm) as compared with the maximum range of the electron beam deflection. The direct writing permits alignment between the various layers better than 1um in any chip. The first test on the developed devices shows high reliability and flexibility of the overall process.
  • Keywords
    Electron radiation effects; Josephson devices; Biomedical optical imaging; Circuit testing; Electrodes; Electron beams; Optical noise; Resistors; Resists; SQUIDs; Silicon; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1064900
  • Filename
    1064900