DocumentCode

1023032

Title

Theory and experiments on the 1/f surface noise of MOS insulated-gate field-effect transistors

Author

Sah, C.T.

Volume

11

Issue

11

fYear

1964

fDate

11/1/1964 12:00:00 AM

Firstpage

534

Lastpage

534

Keywords

Diodes; Electrons; FETs; Fluctuations; Frequency; Insulation; Low-frequency noise; P-n junctions; Solid state circuits; Temperature;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1964.15412

Filename

1473800