DocumentCode
1023061
Title
Influence of single trapped Abricosov´s vortices on the properties of Josephson tunnel junctions
Author
Golubov, A.A. ; Kupriyanov, M.Yu.
Author_Institution
Institute of Solid State Physics, Moskow, USSR
Volume
23
Issue
2
fYear
1987
fDate
3/1/1987 12:00:00 AM
Firstpage
785
Lastpage
787
Abstract
The critical and quasiparticle currents through Josephson tunnel junction are calculated on the basis of the microscopic approach in the case of weak external magnetic field (
) trapping in the form of single vortices. The following situations are considered: 1) single vortex localized in one electrode; 2) one or a number of pairs of misaligned vortices localized in both electrodes with their locations depending on the value and spatial distribution of pinning forces in superconducting films. In both cases quasiparticle current depends only on the densities of states in the vortex cores and is numerically calculated in the whole temperature range 0 < T < TC . For all values of T thers are pronounced peaks on dIq /dV curves at voltage V=Δ/e. In contrast the critical current is influenced mainly by magnetic field distribution in the junction area. The suppression of total critical current is evaluated for various vortex configurations in the junction.
) trapping in the form of single vortices. The following situations are considered: 1) single vortex localized in one electrode; 2) one or a number of pairs of misaligned vortices localized in both electrodes with their locations depending on the value and spatial distribution of pinning forces in superconducting films. In both cases quasiparticle current depends only on the densities of states in the vortex cores and is numerically calculated in the whole temperature range 0 < T < TKeywords
Josephson devices; Electrodes; Josephson junctions; Magnetic cores; Magnetic fields; Magnetic flux; Magnetic force microscopy; Physics; Solid state circuits; Superconducting films; Temperature distribution;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1064916
Filename
1064916
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