DocumentCode :
1023087
Title :
Stability of silicon-silicon dioxide and silicon-glass interfaces
Author :
Kerr, D.R. ; Logan, Jeremy S. ; Burkhardt, P.J. ; Young, D.R.
Volume :
11
Issue :
11
fYear :
1964
fDate :
11/1/1964 12:00:00 AM
Firstpage :
535
Lastpage :
535
Keywords :
FETs; Fabrication; Frequency; Insulation; Interface states; Silicon compounds; Stability; Tin; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1964.15417
Filename :
1473805
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1023087
