Title :
Current-voltage characteristics of nanoampere Josephson junctions
Author :
Ono, R.H. ; Cromar, M.W. ; Kautz, R.L. ; Soulen, R.J. ; Colwell, J.H. ; Fogle, W.E.
Author_Institution :
Electromagnetic Technology Division, Boulder, Colorado
fDate :
3/1/1987 12:00:00 AM
Abstract :
We have studied the current-voltage characteristics of small area tunnel junctions at temperatures below 1 K. The junctions were made in an edge geometry with a Nb base electrode and had areas less than .05 μm2and critical currents in the nA range. Although the measured I-V characteristics resemble those of ordinary hysteretic junctions, the supposed zero-voltage portion of the curve proved to have a finite slope and to deviate from zero voltage. For these junctions it is apparently possible for occasional 2π phase slips to occur without switching to the usual voltage state. This behavior can be explained either by macroscopic quantum tunneling or by a model in which the effective shunt conductance of the junction is frequency dependent.
Keywords :
Josephson devices; Critical current; Current-voltage characteristics; Electrodes; Geometry; Hysteresis; Josephson junctions; Niobium; Temperature distribution; Tunneling; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1064932