• DocumentCode
    1023251
  • Title

    Current-voltage characteristics of nanoampere Josephson junctions

  • Author

    Ono, R.H. ; Cromar, M.W. ; Kautz, R.L. ; Soulen, R.J. ; Colwell, J.H. ; Fogle, W.E.

  • Author_Institution
    Electromagnetic Technology Division, Boulder, Colorado
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    1670
  • Lastpage
    1673
  • Abstract
    We have studied the current-voltage characteristics of small area tunnel junctions at temperatures below 1 K. The junctions were made in an edge geometry with a Nb base electrode and had areas less than .05 μm2and critical currents in the nA range. Although the measured I-V characteristics resemble those of ordinary hysteretic junctions, the supposed zero-voltage portion of the curve proved to have a finite slope and to deviate from zero voltage. For these junctions it is apparently possible for occasional 2π phase slips to occur without switching to the usual voltage state. This behavior can be explained either by macroscopic quantum tunneling or by a model in which the effective shunt conductance of the junction is frequency dependent.
  • Keywords
    Josephson devices; Critical current; Current-voltage characteristics; Electrodes; Geometry; Hysteresis; Josephson junctions; Niobium; Temperature distribution; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1064932
  • Filename
    1064932