Title :
Generation currents, noise and auger suppression in intrinsic diodes
Author :
White, Amanda M. ; Humphreys, R.G.
Author_Institution :
Royal Signals & Radar Establishment, Great Malvern, UK
Abstract :
The total diffusion-limited current and shot noise in intrinsic diodes do not depend explicitly on the detailed forms of the individual generation processes, but only on the current and noise of each process acting in isolation. Auger-like processes are relatively suppressed in high reverse bias.
Keywords :
electron device noise; semiconductor device models; semiconductor diodes; Auger suppression; diffusion-limited current; generation currents; generation processes; high reverse bias; intrinsic diodes; models; noise suppression; shot noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860428
