Title :
Limits of FET modelling by lumped elements
Author :
Heinrich, Wolfgang
Author_Institution :
Technische Hochschule Darmstadt, Institut fÿr Hochfrequenztechnik, Darmstadt, West Germany
Abstract :
Common lumped-element FET modelling is compared with the equivalent distributed-element formulation. The deviations are studied and the validity range of such lumped-element models is shown.
Keywords :
field effect transistors; lumped parameter networks; semiconductor device models; solid-state microwave devices; MESFET; deviations; distributed-element formulation; limitations; lumped-element FET modelling; microwave FET; validity range;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860432
