DocumentCode
1023700
Title
60 GHz low-noise high-electron-mobility transistors
Author
Duh, K.H.G. ; Chao, P.C. ; Smith, P.M. ; Lester, L.F. ; Lee, B.R.
Author_Institution
General Electric Company, Electronics Laboratory, Syracuse, USA
Volume
22
Issue
12
fYear
1986
Firstpage
647
Lastpage
649
Abstract
The noise performance of 0.25 ¿m-gate-length high-electron-mobility transistors at frequencies up to 62 GHz is reported. A room-temperature extrinsic transconductance gm of 480 mS/mm and a maximum frequency of oscillation fmax of 135 GHz are obtained for these transistors. At 30 and 40 GHz the devices exhibit minimum noise figures of 1.5 and 1.8 dB with associated gains of 10.0 and 7.5 dB, respectively. A minimum noise figure as low as 2.7 dB with an associated gain of 3.8 dB has also been measured at 62 GHz. This is the best noise performance ever reported for HEMTs at millimetre-wave frequencies. The results clearly demonstrate the potential of short-gate-length high-electron-mobility transistors for very low-noise applications for frequencies at least up to V-band.
Keywords
electron device noise; high electron mobility transistors; solid-state microwave devices; EHF; HEMT; MM-wave transistors; MMW; V-band; frequency 60 GHz; gains; gate length 250 nm; high-electron-mobility transistors; low noise transistors; maximum frequency of oscillation; millimetre-wave frequencies; noise figures; noise performance; room-temperature extrinsic transconductance; short-gate-length;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860443
Filename
4256641
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